TY  - GEN
T1  - Software failure investigation a near-miss analysis approach
A1  - Eloff, Jan H. P.
A1  - Bihina Bella, Madeleine
LA  - English
PP  - Cham
PB  - Springer International Publishing AG
YR  - 2018
UL  - https://ds.mainlib.upd.edu.ph/Record/UP-99796217613281279
SN  - 9783319613345 (online ISBN)
KW  - Software failures.
KW  - Software engineering.
KW  - Electronic books.
ER  -