Результати пошуку - "Integrated circuits Very large scale integration Testing."

VLSI testing digital and mixed analogue/digital techniques за авторством Hurst, Stanley L.

Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access

Introduction to VLSI testing за авторством Feugate, Robert J. 1946-

VLSI testing digital and mixed analogue/digital techniques за авторством Hurst, Stanley L.

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy

Diagnostic measurements in LSI/VLSI integrated circuits production за авторством Jakubowski, Andrzej

Debug automation from pre-silicon to post-silicon за авторством Dehbashi, Mehdi, Fey, Gorschwin

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits за авторством Bushnell, Michael L. 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits за авторством Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
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Algorithmic and knowledge based CAD for VLSI

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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