Diagnostic measurements in LSI/VLSI integrated circuits production

Bibliographic Details
Main Author:	Jakubowski, Andrzej
Other Authors:	Marciniak, Wieslaw, Przewlocki, Henryk M.
Format:	Book
Language:	English
Published:	Singapore World Scientific 1991.
Subjects:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.