Strausser, Y., Brundle, C. R., & Evans, C. A. (2010). Characterization in silicon processing. Momentum Press.
Chicago Style (17th ed.) CitationStrausser, Yale, C. Richard Brundle, and Charles A. Evans. Characterization in Silicon Processing. New York: Momentum Press, 2010.
MLA (9th ed.) CitationStrausser, Yale, et al. Characterization in Silicon Processing. Momentum Press, 2010.
Warning: These citations may not always be 100% accurate.