Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Bibliographic Details
Main Authors:	Posser, Gracieli (Author), Sapatnekar, Sachin S. 1967- (Author), Reis, Ricardo (Author)
Corporate Author:	SpringerLink (Online service)
Format:	Electronic Resource
Language:	English
Published:	Cham Springer [2017]
Subjects:	Logic circuits. Electrodiffusion. Electronic books.
Online Access:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy